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Annealing effect on physical properties of thermally evaporated MnS nanocrystalline films

D. SREEKANTHA REDDY1,* , D. RAJA REDDY1, B. K. REDDY1, A. MALLIKARJUNA REDDY1, K. R. GUNASEKHARa2, P. SREEDHARA REDDY1

Affiliation

  1. Department of Physics, Sri Venkateswara University, Tirupati-517502, India
  2. Department of Instrumentation, Indian Institute of Science, Bangalore-560012, India

Abstract

MnS nano-crystalline films were formed on glass substrates by thermal evaporation technique at room temperature (300 K) and the films were annealed at 573 K. The films were characterized for composition, structure and surface morphology by using EDAX, XRD, SEM and AFM. The optical properties were studied by spectrophotometer. AFM studies showed that all the films were in nanocrystalline form with the grain size varying in the range between 30 - 32 nm and exhibited wurtzite structure. The lattice parameter and band gaps (3.842 – 3.916 eV) increase with increasing annealing temperature..

Keywords

Magnetic Semiconductors, MnS nanocrystalline films, Wurtzite structure, Optical properties.

Submitted at: April 17, 2007
Accepted at: July 15, 2007

Citation

D. SREEKANTHA REDDY, D. RAJA REDDY, B. K. REDDY, A. MALLIKARJUNA REDDY, K. R. GUNASEKHARa, P. SREEDHARA REDDY, Annealing effect on physical properties of thermally evaporated MnS nanocrystalline films, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 7, pp. 2019-2022 (2007)