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Computer program PARAV for calculating optical constants of thin films and bulk materials: Case study of amorphous semiconductors

A. GANJOO1,* , R. GOLOVCHAK1,2

Affiliation

  1. Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015, USA Present address: Glass Technology Center, PPG Industries, Inc, Harmarville, PA, USA
  2. Lviv Scientific Research Institute of Materials of SRC “Carat”, 202, Stryjska str., Lviv, UA-79031, Ukraine

Abstract

A computer program “PARAV” for calculating various optical constants, e.g., the dispersion of refractive index, optical absorption coefficient, optical thickness and optical bandgap, from experimentally measured transmission spectra of bulk materials and thin films is developed. User-friendly interface, convenient input and output of the measured and calculated data in the form of text files are also a feature of this software. Data from amorphous semiconductors (chalcogenide glasses and thin films and a-Si:H) are used as typical examples to check the reliability of the program..

Keywords

Computer program, Transmission spectra, Optical constants, Glass.

Submitted at: April 14, 2008
Accepted at: June 9, 2008

Citation

A. GANJOO, R. GOLOVCHAK, Computer program PARAV for calculating optical constants of thin films and bulk materials: Case study of amorphous semiconductors, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 6, pp. 1328-1332 (2008)