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Corrosion environment detection using an evanescent light absorption technique

V. FOGEL1, N. MIRCHIN1, S. POPESCU1, I. LAPSKER1, A. PELED1,*

Affiliation

  1. Holon Institute of Technology, EE Department, Photonics Laboratory 52 Golomb Str. Holon, Israel- 58102

Abstract

Using the technique of capturing the evanescent light leaking image, we measured the influence of a corrosive environment on nanometric profiles of sputtered ultra-thin a-Au nano-structures of thicknesses in the range 20-90 nm. The films were deposited by sputtering directly on glass substrates serving also as light waveguides. Good agreement was achieved comparing the results of thickness and profiles evaluation for the ultra-thin a-Au nano-structures obtained from mechanical probe profile evaluation vs. the Differential Evanescent Light Intensity technique (DELI) estimations..

Keywords

Nanometer layers, Evanescent field, Corrosion detection.

Submitted at: Aug. 10, 2008
Accepted at: Aug. 28, 2008

Citation

V. FOGEL, N. MIRCHIN, S. POPESCU, I. LAPSKER, A. PELED, Corrosion environment detection using an evanescent light absorption technique, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 9, pp. 2482-2486 (2008)