"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Electrical and optical properties of nanostructured ZnO thin films for optoelectronic applications

L. ION1, M. I. RUSU2, G. SOCOL3, I. N. MIHĂILESCU3, C. TĂZLĂOANU1, S. ANTOHE1,*

Affiliation

  1. University of Bucharest, Faculty of Physics, RO-077125 Măgurele-Ilfov, POB MG-11, Romania
  2. National Institute for Research and Development for Optoelectronics, INOE 2000, 1 Atomistilor Street, Magurele, Romania
  3. National Institute for Plasma Physics, RO-077125 Măgurele-Ilfov, Romania

Abstract

Electrical and optical characterization of ZnO thin films produced by pulsed laser deposition (PLD) have been carried out. The films were deposited under various conditions and were optimized for use in hybrid organic/inorganic photovoltaic cells. XRD spectra revealed they had a polycrystalline structure of wurtzite type, preferentially oriented along the [001] axis situated in the growth direction. With increasing substrate temperature, the texture improves. The electrical properties of the films were studied over a large temperature range. Charge transport occurs through either a conduction band mechanism, at high temperatures, and hopping at temperatures below 60 K. The main defects controlling electrical properties of the films were investigated by the method of thermally stimulated currents..

Keywords

Zinc oxide, PLD, XRD, TSC, Optical properties.

Submitted at: Aug. 5, 2008
Accepted at: Oct. 7, 2008

Citation

L. ION, M. I. RUSU, G. SOCOL, I. N. MIHĂILESCU, C. TĂZLĂOANU, S. ANTOHE, Electrical and optical properties of nanostructured ZnO thin films for optoelectronic applications, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 10, pp. 2599-2602 (2008)