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In-situ transmission electron microscopy: on moving dislocations and mobile grain boundaries

J. T. M. DE HOSSON1,* , W. SOER1

Affiliation

  1. Department of Applied Physics, Materials Science Centre and the Netherlands Institute for Metals Research, University of Groningen, Nijenborgh 4, 9747 AG Groningen, the Netherlands

Abstract

This paper delineates the possibilities of utilizing in situ transmission electron microscopy to unravel dislocation-grain boundary interactions. In situ nanoindentation experiments have been conducted in TEM on ultrafine-grained Al and Al-Mg films with varying Mg contents. The observed propagation of dislocations is markedly different between Al and Al-Mg films, i.e. the presence of solute Mg results in solute drag, evidenced by a jerky-type dislocation motion with a mean jump distance that compares well to earlier theoretical and experimental results. The in situ indentation measurements confirm grain boundary motion as an important deformation mechanism in ultrafine-grained Al when it is subjected to a highly inhomogeneous stress field as produced by a Berkovich indenter. It is found that solute Mg effectively pins high-angle grain boundaries during such deformation. The mobility of low-angle boundaries is not affected by the presence of Mg..

Keywords

Transmission electron microscopy, Moving dislocations, Mobile grain boundaries.

Submitted at: Nov. 14, 2006
Accepted at: June 15, 2007

Citation

J. T. M. DE HOSSON, W. SOER, In-situ transmission electron microscopy: on moving dislocations and mobile grain boundaries, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 6, pp. 1671-1678 (2007)