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Inductive response of ferrites based on resonance effects

N. KONTOS1, A. KTENA2, T. SOFIANOPOULOU1, E. HRISTOFOROU1,*

Affiliation

  1. School of Mining and Metallurgy Engineering, National Technical University of Athens, Zografou Campus, Athens 15780, Greece
  2. Department of Electrical Engineering, TEI of Chalkis, Psahna Euboea, 34400, Greece

Abstract

A method and a setup are presented that allow the investigation of the magneto-inductive phenomenon in the development of position, stress and field sensors, as well as in studying fundamental properties of the used ferromagnetic materials. The phenomenon of resonance in a series RLC circuit is used to study the effect of displacement of the soft ferrite core of the inductor on the peak output voltage across the resistor at resonance. More specifically, the displacement of the core affects the inductance of the circuit and therefore the resonance frequency and the peak output voltage. Several ferrite samples have been used having undergone treatments such as oxidization, annealing and corrosion. The same RLC circuit has also been used to study the effect of applied tensile stress and magnetic field at various frequencies when the core of the inductor is a 25cm long ribbon made of an iron alloy. In this case, the resonance frequency is constant and the output voltage across the resistor is recorded as a function of frequency, stress, and magnetic field. In both cases, the results are correlated to the permeability of the core and the way its permeability changes with respect to the applied stress or field, the frequency of excitation, the treatment it has undergone and its magnetic history. Thus, the presented system may also serve as a tool for determination of the electric and magnetic properties of the under test samples..

Keywords

Inductive response, Resonance, Permeability.

Submitted at: Sept. 9, 2006
Accepted at: Sept. 13, 2006

Citation

N. KONTOS, A. KTENA, T. SOFIANOPOULOU, E. HRISTOFOROU, Inductive response of ferrites based on resonance effects, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 5, pp. 1770-1774 (2006)