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Influence of the thickness on physical properties of chemical bath deposited hexagonal ZnS thin films

F. GÖDE1, C. GÜMÜŞ2,* , M. ZOR1

Affiliation

  1. Physics Department, University of Anadolu 26470 Eskişehir, Turkey
  2. Physics Department, University of Cukurova 01330 Adana, Turkey

Abstract

Hexagonal ZnS thin films of thicknesses ranging between 454 to 750 nm are deposited on a glass substrate by chemical bath deposition at 80 ºC. The ZnS thin films are characterized by X-ray diffraction (XRD) and optical absorption spectroscopy. The films are shown to be crystallized in the hexagonal phase and present a preferential orientation along the c-axis by XRD measurements . Only one peak, corresponding to the (008) phase (2θ=29.5º), appears on the diffractograms. The ZnS films show a high transmission. The optical constants such as refractive index n, extinction coefficient k, real ε1 and imaginary ε2 part of dielectric constant are calculated in the visible region. A reduction in refractive index (n) and the extinction coefficient (k) is observed as film thickness decreases. The electrical conductivity decreased from 1.62x10-9 to 1.32x10-10 (Ω.cm)-1 when the films are annealed at 400 ºC for 1 hour. The temperature-dependent current was measured in the range 27-400 ºC and the activation energy values were obtained using the temperature-dependent current measurements..

Keywords

Chemical bath deposition, ZnS, Refractive index, Electrical conductivity, Activation energy.

Submitted at: June 4, 2007
Accepted at: July 15, 2007

Citation

F. GÖDE, C. GÜMÜŞ, M. ZOR, Influence of the thickness on physical properties of chemical bath deposited hexagonal ZnS thin films, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 7, pp. 2186-2191 (2007)