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Micromagnetic simulation of hysteresis curves for Permalloy based thin films

M. VOLMER1,* , J. NEAMTU2

Affiliation

  1. Physics Department, Transilvania University, 29 Eroilor, Brasov 500036, Romania
  2. Research and Development Institute for Electrical Engineering, 313 Splaiul Unirii, 030138 Bucharest, Romania

Abstract

A computer micromagnetic simulator, based on Stonner-Wolfarth model, was used to obtain the magnetization curves and the magnetoresistive response for Permalloy (Ni80Fe20) based thin films and magnetic multilayers. The films were divided into small elements, single magnetic domains, which interact between them and with the applied magnetic field. The dimensions and the distances between elements are inspired from the films microstructure. The results of computer simulations are compared with the magnetic measurements made with a Vibrating Sample Magnetometer and the agreement concerning the shape of the hysteresis loops, coercive field and the ratio between the remanent to saturation magnetization is very good for films with the magnetic layer thinner than 100 nm. The data are very sensitive on the right choice of the parameters used for simulation..

Keywords

Thin films, Stonner-Wolfarth, Hysteresis loop, Magnetization reversal, Permalloy based films.

Submitted at: Jan. 25, 2007
Accepted at: April 15, 2007

Citation

M. VOLMER, J. NEAMTU, Micromagnetic simulation of hysteresis curves for Permalloy based thin films, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 4, pp. 1147-1150 (2007)