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Nanoparticulate precipitates in Y:123 thin films

A. V. POP1,* , G. ILONCA1, D. RADULESCU2, M. POP3

Affiliation

  1. Faculty of Physics, University Babes-Bolyai, 40084 Cluj-Napoca, Romania
  2. UMF Cluj-Napoca,CM5,str. Tabacarilor, Cluj-Napoca, Romania
  3. Department of Material Processing Engineering, Technical University, Cluj-Napoca, Romania

Abstract

Y:123 high temperature superconductors thin films were obtained by DC magnetron sputtering method. The structure and crystalline orientation is determined by θ−2θ scan obtained by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The Y2O3 nanoprecipitates were evidenced through the complete thickness. The critical current density function of temperature is estimated from a.c. magnetic susceptibility..

Keywords

Y:123 thin film, Nanoparticulate, XRD, TEM, a.c. susceptibility.

Submitted at: Nov. 1, 2006
Accepted at: March 15, 2007

Citation

A. V. POP, G. ILONCA, D. RADULESCU, M. POP, Nanoparticulate precipitates in Y:123 thin films, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 3, pp. 554-556 (2007)