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S. SARAVANAN1,* , R. S. DUBEY1
- Advanced Research Laboratory for Nanomaterials & Device, Department of Nanotechnology, Swarnandhra College of Engineering & Technology, Seetharampuram, Narsapur-534280, West Godavari (A.P.), India
The visible and near-infrared reflective thin film of TiO2/Ag-doped SiO2/TiO2 hybrid structure was successfully deposited on glass substrate using sol-gel spin coating techniques. The prepared thin films were characterized by UV-visible spectroscopy (UV-Vis), X-ray diffractometer (XRD), Fourier transform infrared (FTIR) and Raman spectroscopy to investigate its reflectance, structural, functional elements and vibrational modes of the samples. The UV-Vis spectrum evidenced the highest reflectance at 640 nm. The FTIR and RAMAN spectral peaks exploring the various vibration modes and concerning elements of prepared thin films. The XRD diffraction pattern was endorsed the presence of silver, silica and titanium. Further, the crystallite size was calculated as 8.3 nm using Debye-Scherrer’s formula..
Thin Film, FTIR, Raman, TiO2, Ag-SiO2, XRD.
Submitted at: Nov. 27, 2020
Accepted at: Oct. 7, 2021
S. SARAVANAN, R. S. DUBEY, Optical performance of visible and near-infrared responsive TiO2/Ag doped-SiO2/TiO2 thin films prepared by sol-gel spin-coating method, Journal of Optoelectronics and Advanced Materials Vol. 23, Iss. 9-10, pp. 484-487 (2021)
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