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SATYANARAYANA TALAM1,* , RAMBABU BUSI1, NAGARJUNA GUNNAM2, P. SYAM PRASAD3, VENKATESWARA RAO PENUGONDA4
Affiliation
- Department of EIE, Lakireddy Bali Reddy College of Engg. (A), Mylavaram-521230, Krishna, A.P., India
- Department of Chemistry, S.R.R. & C.V.R. Govt. Degree College, Vijayawada – 520004, India
- Department of Physics, National Institute of Technology (NIT), Warangal-506 004, Telangana State, India
- Department of Physics, The University of the West Indies, Mona Campus, Kingston 7, Jamaica
Abstract
Glasses of particular composition (65-x) P2O5-23CaO-12Na2O: x CuO (0.5 ≤ x ≤ 2.0) mol% was synthesized. Further, the samples were characterized by X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Differential Thermal Analyses (DTA), Fourier Transform Infrared, optical Absorption and luminescence spectroscopy techniques.The XRD patterns recorded at room temperature have confirmed the non-crystalline nature to all glass samples which was also supported by SEM pictures. Shifting of glass transition temperature (Tg) towards lower temperature with the CuO addition is observed from the DTA scans.This observation is an indication of more disorder of glass network. Basic phosphate bands and possible cross linkages with CuO addition have been observed in FTIR spectra of all samples. Optical absorption spectra exhibted two bands in the regions about 335 and 795 nm. Luminescence spectra has exhibited two emission peaks corresponding to the transition of 3D1→1S0 single Cu+ centers and Cu+-Cu+ pairs respectively. From all the results, the sample with high content of CuO found to exhibit more degree of disorder. The reasons for more disorder have been discussed in detail by means of spectroscopic properties..
Keywords
Phosphate glasses, XRD, DTA, Optical absorption, Copper ions.
Submitted at: April 21, 2018
Accepted at: Aug. 20, 2019
Citation
SATYANARAYANA TALAM, RAMBABU BUSI, NAGARJUNA GUNNAM, P. SYAM PRASAD, VENKATESWARA RAO PENUGONDA, Preparation and structural characterization of P2O5-CaO-Na2O: CuO glasses, Journal of Optoelectronics and Advanced Materials Vol. 21, Iss. 7-8, pp. 530-535 (2019)
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