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Radial vectored features for pattern enveloping and retrieval

V. GOEL1, B. S. SOHI2, H. SINGH3

Affiliation

  1. Digital Electronics and Communication Division, Centre for Development of Advanced Computing (C-DAC), Mohali – 160 071 India
  2. Department of Electronics and Communication Engineering, Chandigarh University, Gharuan, Mohali, India
  3. Department of Electronics and Communication Engineering, CEC, Landran, Mohali India

Abstract

Radial vectored features are presented to draw an envelope of the pattern under test and its retrieval. Enveloping a given pattern is an important activity while tracking a moving object. The ordered radial profile is used to draw the envelope of the pattern, while the sorted radial profile is used to identify/recognize/categorize the pattern under test. The radial profile is computed around the centre of mass of the binary pattern. Maximum and minimum radii are accounted for figure aspect and broad symmetry about x- and y-axis. Mean, variance, standard deviation of radii, area, perimeter and Euler number give the degree of matching of the pattern to that from the existing data base, otherwise a new category is generated..

Keywords

Centre of Mass (CoM), Pattern Recognition, Radial Profile, Standard Deviation, Euler Number, Discrete Cosine Transform (dct).

Submitted at: Feb. 17, 2016
Accepted at: Sept. 29, 2016

Citation

V. GOEL, B. S. SOHI, H. SINGH, Radial vectored features for pattern enveloping and retrieval, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 9-10, pp. 878-883 (2016)