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FU XIU-HUA1, CHEN CHEN1,* , XIONG SHI-FU1,2,* , ZHANG JING1
Affiliation
- School of Photo Electronic Engineering, Changchun University of Science and Technology,Changchun 130022, China
- Institute of Functional Crystals,Tianjin University of Technology, Tianjin 300384,China
Abstract
Natural gas leaks frequently during exploitation, transportation, storage and use. It can cause energy loss and even cause fire, explosion and other co nsequences, seriously threaten people's lives and property. Methane is the main component of natural gas, and its effective detection and identification is of great significance for timely detection of natural gas leak age accidents. Various approaches have been proposed to detect methane, however the detection and identification of methane leakage by infrared technology has become a hot topic in the world. A narrow band filter developed based on the infrared characteristic absorption peak of methane is one of the core optical components of the detection system. At present, Narrow band filter for methane infrared imaging system has low peak transmittance and n arrow cut off area.The sensitivity of the system can be improved by increasing the peak transmittance and widening the cut off area. In this paper, the design of the filter is achieved by using the principle of splitting technique. By analy z ing the sensitivity of the membrane layer and adjusting the monitoring mode of the membrane layer, the thickness of the sensitive layer can be controlled accurately. The peak transmittance of the filter reached 87.88% at the wavelength of 7.669μm, the full width of its passband at half maximum is 7 1 nm, which better suppresses the background noise and improves the sensit ivity of the detection system..
Keywords
Optical thin film, Narrow band filter, M onitoring mode , Gas leaks, Sensitivity.
Submitted at: Feb. 16, 2019
Accepted at: Oct. 9, 2019
Citation
FU XIU-HUA, CHEN CHEN, XIONG SHI-FU, ZHANG JING, Realization of a narrow band filter for methane gas detection, Journal of Optoelectronics and Advanced Materials Vol. 21, Iss. 9-10, pp. 577-587 (2019)
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