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Reflection effects in stratified dielectric structures

C. MERTZANIDIS1,* , L. MAGAFAS2

Affiliation

  1. TEI of Kavala, Depart. of Industrial Informatics, 65404 Kavala, Greece
  2. TEI of Kavala, Depart. of Electrical Engineering, 65404 Kavala, Greece

Abstract

The electromagnetic response of a multi – layer half space by means of the ray analysis technique is presented. The influence of the thickness as well as of the electromagnetic constants of the dielectric layers on the reflection coefficient is studied, assuming both pure and lossy dielectrics. The zeros and the periodicities of the reflection coefficient are strongly influenced from the geometrical and the electrical characteristics of the multi – layer half space. Numerical results for several cases show the ability of the ray technique to analyze as well as to design multi – layer media in a given frequency range..

Keywords

Dielectrics, Absorbers, Reflection coefficient, Signal processing.

Submitted at: Nov. 28, 2007
Accepted at: Dec. 7, 2007

Citation

C. MERTZANIDIS, L. MAGAFAS, Reflection effects in stratified dielectric structures, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 12, pp. 3946-3950 (2007)