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Secondary electron emission at Langmuir probe surface

M. L. SOLOMON1,* , S. TEODORU1, G. POPA1

Affiliation

  1. Plasma Physics Department ,Faculty of Physics, “Al. I. Cuza” University, Association EURATOM-MEdC, 11 Carol I Blvd., 700506-Iasi, Romania

Abstract

The phenomena of secondary electron emission appear as a result of interaction between high energy particles and different solid state materials. The present work reports on the study of the secondary electron emission at a Langmuir probe surface bombarded with a mono-kinetic electron beam. A stainless steel plane probe with a diameter of 10 mm was used. The mono-kinetic electron beam with a current intensity of the order of 10 mA was provided by an electron gun. The phenomena of secondary electron emission at the probe surface were studied through the changes in the ion part of the I-V characteristic of the probe, for different kinetic energy of the electron beam, in the range of 50 - 400 eV. PIC simulations accompanied the experimental measurements..

Keywords

Plasma diagnostics, Electrostatic probes, Secondary electron emission.

Submitted at: March 1, 2008
Accepted at: July 10, 2008

Citation

M. L. SOLOMON, S. TEODORU, G. POPA, Secondary electron emission at Langmuir probe surface, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 8, pp. 2011-2014 (2008)