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Some new properties of the micro hollow cathode discharges (MHCD) in xenon

B.-J. LEE1, D.-L. BIBOROSCH2,* , K. FRANK1, L. MARES2

Affiliation

  1. Physics Department I, F.-A.-University of Erlangen, Erwin-Rommel-Str. 1, D-91058 Erlangen, Germany
  2. Faculty of Physics, Dept. of Plasma Physics, 11 Carol I, Al.I.Cuza-University, R-700506 Iasi, Romania

Abstract

Some properties of the micro hollow cathode discharges (MHCD) in xenon are related to their actual geometry. It is shown that for the “standard” geometry, the VUV intensity strongly depends on the electrode side from which this emission is measured. The VUV intensity from the cathode side is by order of magnitudes larger than from the anode side, keeping the other discharge parameters constant. Also from the cathode side an afterglow phenomenon of the VUV emission can be measured by superposing a high voltage pulse. All these phenomena could be correlated with the negative glow which spreads out on the external cathode surface. Finally, at small dc currents, some regular structures of cathode spots into the cathode hole can be observed..

Keywords

Micro hollow cathode discharges; excimer radiation (afterglow); cathode glow structures.

Submitted at: March 1, 2008
Accepted at: July 10, 2008

Citation

B.-J. LEE, D.-L. BIBOROSCH, K. FRANK, L. MARES, Some new properties of the micro hollow cathode discharges (MHCD) in xenon, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 8, pp. 1972-1975 (2008)