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Structural and morphological properties of NiCu magnetic thin films

D. BAZAVAN1, R. BAZAVAN1, I. ENCULESCU2,* , E. MATEI2, L. ION2, S. ANTOHE1

Affiliation

  1. Faculty of Physics, University of Bucharest, 405 Atomistilor, P.O. Box MG-11, 077125, Magurele-Ilfov, Romania
  2. National Institute for Materials Physics, 105b Atomistilor, P.O. Box MG-7, 077125, Magurele-Ilfov, Romania

Abstract

NiCu thin films for magnetic applications have been produced by using an electrochemical method. Their structural and morphological properties have been investigated by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM and EDX) and are discussed in correlation with the growth conditions..

Keywords

NiCu, XRD, SEM, EDX.

Submitted at: Oct. 5, 2008
Accepted at: Nov. 11, 2008

Citation

D. BAZAVAN, R. BAZAVAN, I. ENCULESCU, E. MATEI, L. ION, S. ANTOHE, Structural and morphological properties of NiCu magnetic thin films, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 11, pp. 3054-3057 (2008)