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Structural and morphological properties of thermally evaporated Zn1-xMnxS nanocrystalline films

D. SREEKANTHA REDDY1,* , M. MAHESWARA REDDY2, K. NARASIMHA RAO1, K. R. GUNASEKHAR1, P. SREEDHARA REDDY2

Affiliation

  1. Department of Instrumentation, Indian Institute of Science, Bangalore-560012, India
  2. Department of Physics, Sri Venkateswara University, Tirupati-517502, India

Abstract

In recent years the dilute magnetic semiconductors have received much attention due to the complementary properties of semiconductor and ferromagnetic behaviour. Nanostructured Zn1-xMnxS films (0 ≤ x ≤ 0.25) were deposited on glass substrates at room temperature (300 K) using simple resistive thermal evaporation technique. All the deposited films were characterized by chemical, structural and morphological studies. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) studies showed that all the films investigated were in nanocrystalline form with the grain size lying in the range 8 – 22 nm. All the films exhibited cubic structure and the lattice parameter varied linearly with composition..

Keywords

Diluted Magnetic Semiconductors (DMS), Thermal evaporation technique, Zn1-xMnxS Nanocrystalline films, Morphological studies, Structural studies.

Submitted at: Aug. 19, 2007
Accepted at: Dec. 7, 2007

Citation

D. SREEKANTHA REDDY, M. MAHESWARA REDDY, K. NARASIMHA RAO, K. R. GUNASEKHAR, P. SREEDHARA REDDY, Structural and morphological properties of thermally evaporated Zn1-xMnxS nanocrystalline films, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 12, pp. 3743-3746 (2007)