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Synthesis and characterization of nanocrystalline MgxZn 1-xO films deposited by spin coating method

B. K. SONAWANE1, M. P. BHOLE1, D. S. PATIL1,*

Affiliation

  1. Department of Electronics, North Maharashtra University, Jalgaon [Maharashtra], India

Abstract

Analysis of structural, optical, chemical and mechanical properties of sol-gel deposited nanocrystalline MgxZn 1-xO thin films has been carried. Zinc acetate, Magnesium acetate as precursors and ethanol as solvent were used to prepare the gel solution. Films were deposited on silicon (100) substrate for different Mg concentrations (x = 0.05 to 0.3). The annealing was carried out at temperature 400°C to achieve dense crystalline nature of the films. EDAX spectrum clearly shows the incorporation of Mg into ZnO. The effect of Mg doping concentration on various properties of MgxZn 1-xO films has been investigated. XRD spectra clearly reveal the peaks of ZnO. The refractive index of the films was observed to be decrease with an increasing Mg mole fraction. FTIR study depicts the stretching bond position of fundamental ZnO peak to be shifted from 407 to 415 cm-1 ..

Keywords

Nanocrystalline, MgxZn1-xO, Refractive index.

Submitted at: Oct. 29, 2009
Accepted at: Nov. 19, 2009

Citation

B. K. SONAWANE, M. P. BHOLE, D. S. PATIL, Synthesis and characterization of nanocrystalline MgxZn 1-xO films deposited by spin coating method, Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 11, pp. 1843-1847 (2009)