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TEM observation of two- dimensional defects in CdTe crystals

T. I. MILENOV1,* , V. I. DIMOVa2, M. M. GOSPODINOV1

Affiliation

  1. Institute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee Blvd., 1784 Sofia, Bulgaria
  2. Central Laboratory of Mineralogy and Crystallography, Bulgarian Academy of Sciences, 107 Acad. G. Bonchev str., Sofia 1113, Bulgaria

Abstract

A specimen from a melt-grown CdTe crystal was prepared by the “suspension” method. Selected area electron diffraction (SAED) image revealed the presence of stacking faults and a twice twinned crystal lattice in the examined specimen. Many dislocations, stacking faults as well as first-order and second-order twin boundaries, accompanied by many dislocations lying in (or close to) the grain boundary plane were observed in the diffraction contrast mode images. The main types of the existing defects were modeled, and the corresponding SAED pattern images were successfully simulated..

Keywords

CdTe, Transmission electron microscopy, Lattice defects, Computer simulation.

Submitted at: Nov. 1, 2006
Accepted at: Feb. 15, 2007

Citation

T. I. MILENOV, V. I. DIMOVa, M. M. GOSPODINOV, TEM observation of two- dimensional defects in CdTe crystals, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 2, pp. 289-292 (2007)