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The additions effect on the microstructure and magnetic properties of [NdFeB/M]×n thin films

H. CHIRIAC1, M. GRIGORAS1, M. URSE1,*

Affiliation

  1. National Institute of R&D for Technical Physics Iasi, 47 Mangeron Blvd., 700050 Iasi, Romania

Abstract

This paper reports some results concerning the influence of the Cu, Nb, and NbCu as additions M and Nb, Ta and NbCu as buffer and capping layers N on the microstructure and magnetic properties of multilayer N/[NdFeB/(M)]⋅n/N thin films. The materials used as additions were ‘mixed’ with NdFeB alloy either by stratification as multilayer system or by disposing of the additions on the target’s surface and simultaneously by stratification as multilayer system. When the additions were introduced in NdFeB alloy by stratification, the thickness of individual NdFeB layer was held fixed at 180 nm, while the M spacer layer thickness was varied from 3 to 10 nm. The Si/NbCu/[NdFeBNbCu(180nm)/NbCu (3nm)]⋅3/NbCu and Si/Ta/NdFeBNbCu(540nm)/Ta systems exhibit an enhanced coercivity of about 1510 kA/m and 1580 kA/m, respectively, in comparison with the NdFeB single layer having the same thickness..

Keywords

Thin film, Multilayer, Hard magnetic properties, Magnetization, Coercive field, Remanence ratio.

Submitted at: Jan. 25, 2007
Accepted at: April 15, 2007

Citation

H. CHIRIAC, M. GRIGORAS, M. URSE, The additions effect on the microstructure and magnetic properties of [NdFeB/M]×n thin films, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 4, pp. 1165-1168 (2007)