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The ferroectric-electric characterization of PZT-PbS composites

V. STANCU1, M. BUDA1, L. PINTILIE2,* , M. POPESCU1,* , F. SAVA1

Affiliation

  1. National Institute of Materials Physics Bucharest-Magurele, P. O. Box MG-7, 77125, Romania
  2. Max Planck Institute of Microstructure Physics, Weinberg 2, Halle, 06129 Germany

Abstract

A new method for the preparation of PbS/PZT composite materials is proposed. The PZT matrix has been obtained using the sol-gel method on Pt-coated Si substrates. The PbS (nano) crystals were subsequently obtained by dipping the porous PZT matrix in Pb(NO3)2 and Na2S solutions at room temperature. The XRD spectra show the presence of the tetragonal phase of PZT. The microstructure of the film was analyzed using scanning electron microscopy (SEM) and atomic force microscopy (AFM). The size of the PbS (nano)-particles at the sample’s surface is about 25 nm, estimated from the AFM analysis. The roughness of the sample’s surface is about 5 nm. The porosity of the composite, estimated from the SEM analysis in cross-section is smaller than for the reference PZT porous matrix. The equivalent dielectric constant of the composite increases by a factor of 4-5 in comparison with the porous PZT reference and does not depend on the thickness of the surface PbS (nano)-crystalline layer. The saturated polarization (Ps) value for the PZT-PbS composite is smaller than that corresponding to the bulk PZT but higher than for the reference porous PZT. We attribute these effects to the partial filling of the pores in the PZT matrix with PbS..

Keywords

Composite PZT-PbS, Sol-gel, Dipping.

Submitted at: Nov. 14, 2006
Accepted at: May 15, 2007

Citation

V. STANCU, M. BUDA, L. PINTILIE, M. POPESCU, F. SAVA, The ferroectric-electric characterization of PZT-PbS composites, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 5, pp. 1516-1520 (2007)