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The structural and optical characterization of thin-film ZnTe/CdSe heterojunctions

P. PREPELITA1, G. I. RUSU1,* , C. PIRGHIE2

Affiliation

  1. “Al.I. Cuza” University, 11 Carol I Bd., 700506 Iasi, Romania
  2. Stefan cel Mare University, 9 Universitatii Str., 720225 Suceava, Romania

Abstract

The thin-film ZnTe/CdSe heterojounctions were prepared onto glass substrates covered with a transparent conducting SnO2 layer. ZnTe (d=74-771 nm) and CdSe (d=843-1322 nm) thin films were deposited by thermal evaporation (cvasi-closed volume technique) under vacuum. Deposition conditions: deposition rate rd=15 Å/s; substrate temperature, Ts=300 K-500 K; source temperature, Tev=1000 K-1300 K. Structural investigations, performed by X-ray diffraction technique, and atomic force microscopy, showed that studied samples are polycrystalline and have a zinc blende (ZnTe) or wurtzite (CdSe) structure. Transmission and absorption spectra were studied (in the spectral range 300-1400 nm) both for component films and heterojounctions..

Keywords

ZnTe, CdSe, Thin films, Heterojonctions, X-ray diffraction, AFM, Optical properties.

Submitted at: July 3, 2007
Accepted at: Oct. 15, 2007

Citation

P. PREPELITA, G. I. RUSU, C. PIRGHIE, The structural and optical characterization of thin-film ZnTe/CdSe heterojunctions, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 10, pp. 3200-3205 (2007)