"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Total ionizing dose degradation of power bipolar integrated circuit

V. VUKIĆ1,* , P. OSMOKROVIĆ2

Affiliation

  1. Institute of Electrical Engineering "Nikola Tesla", Koste Glavinića 8a, 11000 Beograd, Serbia
  2. University of Belgrade, Faculty of Electrical Engineering, Bulevar Kralja Aleksandra 73, p. fah 35 - 54, 11000 Beograd, Serbia

Abstract

Variations of ionizing dose response in terms of various types of radiation and bias conditions were presented for voltage regulator produced in "National Semiconductor" bipolar process. Technological realization of monolithic integrated circuit, also as its impact on device's degradation were shown. Manifestations of surface recombination mechanisms in semiconductor and positive charge trapping in oxide were presented. Changes of serial transistor's maximum collector current, collector - emitter dropout voltage, output voltage and load regulation characteristics were presented for voltage regulators from two batches made by the same manufacturer. Examined samples showed severe characteristics degradation even at low and medium total ionizing dose levels, indicating low radiation hardness of "National Semiconductor" bipolar process. Devices from various lots showed significant differences in radiation response..

Keywords

Ionizing radiation, Bipolar process, Lateral transistor, Surface recombination, Voltage regulator.

Submitted at: Sept. 10, 2007
Accepted at: Jan. 18, 2008

Citation

V. VUKIĆ, P. OSMOKROVIĆ, Total ionizing dose degradation of power bipolar integrated circuit, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 1, pp. 219-228 (2008)