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X-ray photoelectron spectroscopic study of composite glass fillers

V. SIMON1,* , A. COLCERIU2, C. PREJMEREAN2, M. MOLDOVAN2, M. PRINZ3, M. NEUMANN3

Affiliation

  1. Babes-Bolyai University, Faculty of Physics, 400084 Cluj-Napoca, Romania
  2. Raluca Ripan Institute of Chemistry, 400294 Cluj-Napoca, Romania
  3. University of Osnabrück, Physics Department, 49069 Osnabrück, Germany

Abstract

Modern dental practice has become very dependent on its materials, such that a great challenge in restorative stomatology is choosing the right combinations of materials. Dental composites consisting of a polymerisable matrix and glass filler particles attracted a large interest. In this study are investigated by X-ray Photoelectron Spectroscopy (XPS) four composite materials obtained from about 1/4 organic phase and 3/4 inorganic phase in form of oxide glass powder. C 1s core level spectra were analysed in order to get information on functional groups. The O 1s core level peaks for all samples show that the environments around the oxygen atoms are similar and according to binding energy values they denote non-bridging oxygens in the investigated composites..

Keywords

XPS, composites, dental fillers.

Submitted at: March 23, 2007
Accepted at: Nov. 16, 2007

Citation

V. SIMON, A. COLCERIU, C. PREJMEREAN, M. MOLDOVAN, M. PRINZ, M. NEUMANN, X-ray photoelectron spectroscopic study of composite glass fillers, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 11, pp. 3350-3353 (2007)